Li, Hongliang, <pre><span>Microsystem</span> <span>&</span> <span>Terahertz</span> Research Center, China Academy of Engineering Physics</pre>
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The 8th International Conference on Computational Methods (ICCM2017) - MS-000 General Papers
3D Simulation of the Defect Generation by Hydrogen at $Si-SiO_2$ Interface
Abstract PDF
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